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Fullerene (C60) interlayer modification on the electronic structure and the film growth of 2,7-diocty[1]benzothieno-[3,2-b]benzothiophene on SiO2

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成果类型:
期刊论文
作者:
Zhao, Yuan;Liu, Xiaoliang*;Lyu, Lu;Li, Lin;Tan, Wenjun;...
通讯作者:
Liu, Xiaoliang;Gao, Yongli
作者机构:
[Tan, Wenjun; Li, Lin; Wang, Shitan; Gao, Yongli; Liu, Xiaoliang; Gao, YL; Xie, Haipeng; Wang, Can; Niu, Dongmei; Huang, Han; Lyu, Lu; Zhao, Yuan] Cent S Univ, Inst Super Microstruct & Ultrafast Proc Adv Mat, Sch Phys & Elect, Changsha 410083, Hunan, Peoples R China.
[Lyu, Lu] Univ Kaiserslautern, Dept Phys, Erwin Schrodinger Str 46, D-67663 Kaiserslautern, Germany.
[Lyu, Lu] Univ Kaiserslautern, Res Ctr OPTIMAS, Erwin Schrodinger Str 46, D-67663 Kaiserslautern, Germany.
[Li, Lin] Cent South Univ Forestry & Technol, Sch Elect & Informat Engn, Changsha 410004, Hunan, Peoples R China.
[Gao, Yongli] Univ Rochester, Dept Phys & Astron, Rochester, NY 14627 USA.
通讯机构:
[Liu, XL; Gao, YL] C
Cent S Univ, Inst Super Microstruct & Ultrafast Proc Adv Mat, Sch Phys & Elect, Changsha 410083, Hunan, Peoples R China.
语种:
英文
关键词:
Ultra-thin C-60 insertion layer;2,7-Diocty[1]benzothieno-[3,2-b]benzothiophene (C8-BTBT);Electronic structure;Molecular packing;PES(UPS, XPS);AFM
期刊:
Synthetic Metals
ISSN:
0379-6779
年:
2017
卷:
229
页码:
1-6
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [51673217, 11334014]; National Science FoundationNational Science Foundation (NSF) [DMR-1303742, CBET-1437656]
机构署名:
本校为其他机构
院系归属:
计算机与信息工程学院
摘要:
Modification by ultra-thin fullerene (C60) insertion layer of about 1 monolayer on the electronic structure and the film growth of 2,7-diocty[1]benzothieno-[3,2-b]benzothiophene (C8-BTBT) on silicon oxide (SiO2) is investigated using ultraviolet photoelectron spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and X-ray diffraction (XRD). It is found that the ultra-thin C60insertion layer doesn't induce an ambipolar charge transport characteristic but it indeed lifts up the energy levels of C8-BTBT, resulting in p-doping and hole accumulation at the semico...

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