The surface profiles of retrograded rice starch (RS) samples stored at different times were obtained by horizontal sectioning and scanning electron microscopy (SEM). SEM images showed that the surface topography of the retrograded RS samples possessed fractal characteristics, which was also proven by fractal analysis. The fractal features for analysis were extracted using a new image processing method. The average fractal dimensions of the retrograded RS samples stored for 1, 5, 10, and 15 days were 1.6587, 1.7333, 1.7807, and 1.8340, respectively. The method indicated that the fractal dimensi...
