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Current and Gate Capacitance Models of Amorphous InGaZnO Transistors With Double-Layer Electrolytic Gate Insulation

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成果类型:
期刊论文
作者:
Wang, Lu;Xu, Piao-Rong;Zeng, Qing-Min;Cai, Min-Xi;Liu, E-Xian;...
通讯作者:
Xu, PR
作者机构:
[Liu, Gen-Hua; Xu, Piao-Rong; Wang, Lu; Zeng, Qing-Min; Liu, E-Xian; Xu, PR; Wang, Meng; Shan, Zheng-Ping] Cent South Univ Forestry & Technol, Coll Comp & Informat Engn, Changsha 410004, Peoples R China.
[Cai, Min-Xi] Hunan Univ Arts & Sci, Coll Math & Phys, Changde 415000, Peoples R China.
通讯机构:
[Xu, PR ] C
Cent South Univ Forestry & Technol, Coll Comp & Informat Engn, Changsha 410004, Peoples R China.
语种:
英文
关键词:
Capacitance;Logic gates;Electrolytes;Electric potential;Voltage;Insulators;Resistance;Ions;Transistors;Impedance;Electrolytic double-layer gate insulation transistor (EDLGIT);equivalent capacitance;surface potential
期刊:
IEEE Transactions On Electron Devices
ISSN:
0018-9383
年:
2025
卷:
72
期:
2
页码:
683-689
基金类别:
10.13039/501100001809-National Natural Science Foundation of China (Grant Number: 62204084) Research Foundation of Education Bureau of Hunan Province (Grant Number: 21B0267) 10.13039/501100014879-Central South University of Forestry and Technology Foundation (Grant Number: 0409-2016 and 0z85-2018)
机构署名:
本校为第一且通讯机构
院系归属:
计算机与信息工程学院
摘要:
Electrolytic double-layer gate insulation transistors (EDLGITs) have gained significant attention recently due to their features for achieving high-density charge accumulation and low operating voltage. This is primarily attributed to the large capacitance of the electrolyte insulation in these devices. This article proposes a physical model for the capacitance of the electrolytic double-layer gate insulation (EDLGI) and the drain current of amorphous InGaZnO (a-IGZO) EDLGITs based on the channel surface potential. It is demonstrated that the EDLGI capacitance, which comprises the compact-laye...

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