版权说明 操作指南
首页 > 成果 > 成果详情

Ultrahigh-Quality-Factor Topological Photonic Crystal Refractive Index Sensor Based on Second-Order Corner State

认领
导出
Link by DOI
反馈
分享
QQ微信 微博
成果类型:
期刊论文
作者:
Guo Sheng;Kang She;Zhengping Shan;Piaorong Xu;Lin Li;...
作者机构:
[Guo Sheng; Kang She; Zhengping Shan; Piaorong Xu; Lin Li; Exian Liu] College of Computer and Information Engineering, Central South University of Forestry and Technology, Changsha, China
语种:
英文
期刊:
IEEE Sensors Journal
ISSN:
1530-437X
年:
2025
卷:
25
期:
6
页码:
9273-9281
基金类别:
10.13039/501100005046-Natural Science Foundation of Hunan Province (Grant Number: 2023JJ41060) 10.13039/100014472-Scientific Research Foundation of Hunan Provincial Education Department (Grant Number: 22B0273) Education Department Key Program of Hunan Province (Grant Number: 22A0190 and 21A0160) Changsha Municipal Natural Science Foundation (Grant Number: kq2202295)
机构署名:
本校为第一机构
院系归属:
计算机与信息工程学院
摘要:
Owing to the flexible light control and the immunity to defects and impurities, topological photonic crystals (TPC) are considered an excellent platform in the engineering of optoelectronic devices. Herein, four TPC refractive index (RI) sensors are theoretically proposed based on the su-Schrieffer-Heeger (SSH) model. Zero-dimensional topological corner states (TCS) and 1-D topological edge states (TES) are demonstrated by the band structure and the Zak phases. Four TPC sensors are based on single topological microcavity (TCS formed by two TES ...

反馈

验证码:
看不清楚,换一个
确定
取消

成果认领

标题:
用户 作者 通讯作者
请选择
请选择
确定
取消

提示

该栏目需要登录且有访问权限才可以访问

如果您有访问权限,请直接 登录访问

如果您没有访问权限,请联系管理员申请开通

管理员联系邮箱:yun@hnwdkj.com