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An Analytical Model for Weak Avalanche Induced Kink Effect of PDSOI nMOSFETs

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成果类型:
期刊论文
作者:
Xu, Ziyong;Liu, Xiaonian
通讯作者:
Liu, XN
作者机构:
[Xu, Ziyong] Cent South Univ Forestry & Technol, Bangor Coll, Changsha 410004, Peoples R China.
[Liu, Xiaonian; Liu, XN] Hunan Normal Univ, Sch Phys & Elect, Changsha 410081, Peoples R China.
通讯机构:
[Liu, XN ] H
Hunan Normal Univ, Sch Phys & Elect, Changsha 410081, Peoples R China.
语种:
英文
关键词:
Silicon-on-insulator;MOSFET;Logic gates;Threshold voltage;Silicon;Mathematical models;Integrated circuit modeling;Body bias effect;floating body;impact ionizing;parasitic bipolar junction transistor (BJT);partially-depleted silicon-on-insulator (PDSOI);pinch-off;weak avalanche
期刊:
IEEE Transactions On Electron Devices
ISSN:
0018-9383
年:
2023
卷:
70
期:
7
页码:
3430-3436
基金类别:
This work was supported in part by the National Natural Science Foundation of China under Grant 62204083 and in part by the Youth Fund of Education Department of Hunan Province under Grant 21B0057.
机构署名:
本校为第一机构
院系归属:
班戈学院
摘要:
Silicon-on-insulator (SOI) devices and circuits are widely used in semiconductor industry for its superior natures on integration density, isolations degree. Inefficient body contact of partially-depleted SOI (PDSOI) devices cannot evacuate excess carriers which transported from the weak avalanche multiplication of pinch-off region at high drain voltage bias. These accumulated carriers elevate the internal body potential and trigger electrical effects namely the body bias effect of threshold voltage and the turn-on of parasitic bipolar junction...

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